Manual Probe Stations

Manual Probe Stations

1. Single machine multi-application design

Suitable for a variety of wafer/integrated circuit/power device/optical material measurement applications, such as RF and DC, IV/CV testing wafer-level reliability.

2. Ergonomics design

Xy-axis fine-tuning design/Y-axis quick import and export/stage design.

Sturdy workbench that can carry up to 10 DC or 4 RF micropositioners.

Large stroke fast guide rail drive with micrometer fine adjustment movement.

3. Flexible selection and upgradeability

There are also a variety of wafer stages that can be upgraded, and many accessories such as DC/RF/mmW micropositioners, optical microscopes, electromagnetic shielding boxes/anti-shock systems can be installed to fully support your application needs.

4. High-voltage human-machine safety protection design (optional)

Platen bottom features polymer high pressure protection design.

Chuck's unique safety isolation and protection design.

The needle bar (standard SHV Coaxia l interface) is a universal Keithley & Keysight high-voltage instrument designed with German PEEK double-layer high-voltage protection ring sleeve.

Infrared sensing interlock safety interlock mechanism.